MLG1005SR10JT000
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Inductor High Frequency Chip Unshielded Multi-Layer 0.1uH 5% 100MHz 8Q-Factor Ceramic 0.2A 2Ohm DCR 0402 T/R
| Shielded | NO |
| Application | RF INDUCTOR |
| Construction | Rectangular |
| Core Material | CERAMIC |
| Inductor Type | GENERAL PURPOSE INDUCTOR |
| Package Style (Meter) | SMT |
| Surface Mount | YES |
| Tolerance (%) | 5 |
| Case/Size Code | 0402 |
| J-STD-609 Code | e3 |
| Packing Method | TR, PUNCHED PAPER, 7 INCH |
| Terminal Shape | WRAPAROUND |
| Terminal Finish | Tin (Sn) - with Nickel (Ni) barrier |
| Package Width (mm) | 0.5 |
| Terminal Placement | DUAL ENDED |
| DC Resistance (ohm) | 2 |
| Number of Functions | 1 |
| Number of Terminals | 2 |
| Package Height (mm) | 0.5 |
| Package Length (mm) | 1 |
| Test Frequency (MHz) | 100 |
| Rated Current-Max (A) | 0.2 |
| Shape/Size Description | RECTANGULAR PACKAGE |
| Inductance-Nom (L) (uH) | 0.1 |
| Quality Factor-Min (at L-nom) | 8 |
| Self Resonance Frequency (MHz) | 700 |
| Operating Temperature-Max (Cel) | 125 |
| Operating Temperature-Min (Cel) | -55 |
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CONTACT REASON
Sourceability North America, LLC
9715 Burnet Rd, Ste 200You can download the user manual and technical specifications for TDK Corporation MLG1005SR10JT000 in the documentation section.
Inductor High Frequency Chip Unshielded Multi-Layer 0.1uH 5% 100MHz 8Q-Factor Ceramic 0.2A 2Ohm DCR 0402 T/R
As a typical representative of the subcategory Passives, MLG1005SR10JT000 is used to control the level of current and voltage in electrical circuits. Its Inductor High Frequency Chip Unshielded Multi-Layer 0.1uH 5% 100MHz 8Q-Factor Ceramic 0.2A 2Ohm DCR 0402 T/R ensures stable resistance, which is critical for precise measurements and component protection.
MLG1005SR10JT000 from the category Passives by manufacturer TDK Corporation provides precise current limitation in the scheme. Thanks to its Inductor High Frequency Chip Unshielded Multi-Layer 0.1uH 5% 100MHz 8Q-Factor Ceramic 0.2A 2Ohm DCR 0402 T/R, it contributes to stable operation of electronic devices, preventing overloads and voltage fluctuations.
