WR12W3R30FTLJ
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Res Thick Film 1206 3.3 Ohm 1% 0.25W(1/4W) -200ppm/°C to 400ppm/°C Sulfur Resistant Pad SMD T/R Automotive AEC-Q200
| Size Code | 1206 |
| Technology | METAL GLAZE/THICK FILM |
| Construction | Rectangular |
| Package Shape | RECTANGULAR PACKAGE |
| Package Style (Meter) | SMT |
| Resistor Type | FIXED RESISTOR |
| Tolerance (%) | 1 |
| J-STD-609 Code | e3 |
| Packing Method | TR, PAPER, 7 INCH |
| Terminal Shape | WRAPAROUND |
| Terminal Finish | Matte Tin (Sn) - with Nickel (Ni) barrier |
| Mounting Feature | SURFACE MOUNT |
| Resistance (ohm) | 3.3 |
| Additional Feature | LASER TRIMMABLE |
| Package Width (mm) | 1.6 |
| Number of Terminals | 2 |
| Package Height (mm) | 0.55 |
| Package Length (mm) | 3.1 |
| Working Voltage (V) | 200 |
| Rated Temperature (Cel) | 70 |
| Operating Temperature-Max (Cel) | 155 |
| Operating Temperature-Min (Cel) | -55 |
| Rated Power Dissipation (P) (W) | 0.25 |
| Temperature Coefficient (ppm/Cel) | -200,400 |
| Screening Level / Reference Standard | AEC-Q200 |
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CONTACT REASON
Sourceability North America, LLC
9715 Burnet Rd, Ste 200You can download the user manual and technical specifications for Walsin Technology Corporation WR12W3R30FTLJ in the documentation section.
Res Thick Film 1206 3.3 Ohm 1% 0.25W(1/4W) -200ppm/°C to 400ppm/°C Sulfur Resistant Pad SMD T/R Automotive AEC-Q200
As a typical representative of the subcategory Passives, WR12W3R30FTLJ is used to control the level of current and voltage in electrical circuits. Its Res Thick Film 1206 3.3 Ohm 1% 0.25W(1/4W) -200ppm/°C to 400ppm/°C Sulfur Resistant Pad SMD T/R Automotive AEC-Q200 ensures stable resistance, which is critical for precise measurements and component protection.
WR12W3R30FTLJ from the category Passives by manufacturer Walsin Technology Corporation provides precise current limitation in the scheme. Thanks to its Res Thick Film 1206 3.3 Ohm 1% 0.25W(1/4W) -200ppm/°C to 400ppm/°C Sulfur Resistant Pad SMD T/R Automotive AEC-Q200, it contributes to stable operation of electronic devices, preventing overloads and voltage fluctuations.
